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Job Description

The successful candidate will work with Prof Barbaros Oezyilmaz and Dr Toh Chee Tat on the structural analysis and characterization of Monolayer Amorphous Carbon (MAC) and related low-dimensional materials.

The main responsibilities of the position include:

1. Advanced Microscopic Characterization: Perform atomic-resolution imaging of MAC and MAC-heterostructures using aberration-corrected Scanning Transmission Electron Microscopy (STEM).

2. Chemical & Bonding Analysis: Conduct Electron Energy Loss Spectroscopy (EELS) to quantify sp2/sp3 bonding ratios and analyze the local chemical environment of amorphous carbon networks.

3. Low-Voltage Imaging Optimization: Develop and optimize imaging protocols at low accelerating voltages (60-80 kV) to minimize knock-on damage in light-element 2D materials.

4. Sample Preparation: Execute polymer-free transfer of ultra-thin MAC films onto TEM grids and prepare cross-sectional samples of 2D-heterostructures using Focused Ion Beam (FIB) techniques.

5. Data Analysis: Perform advanced image simulation and processing to correlate atomic-scale structural defects with the dielectric performance of MAC.

Qualifications/Requirements

Qualifications / Discipline: Bachelor's or Master's degree in materials science, microelectronics, or related fields.

Skills:

• Expertise in aberration-corrected STEM and EELS, specifically for light elements (Carbon/Boron/Nitrogen).

• Demonstrated proficiency in operating TEMs at low voltages (≤ 80 kV) for imaging beam-sensitive soft materials or carbon nanostructures.

• Strong verbal communication skills in English and a track record of peer-reviewed publications in high-impact journals related to 2D materials.

Experience:

1. Extensive hands-on experience with the characterization of 2D materials.

2. Proven ability to perform quantitative analysis of atomic disorder and bonding hybridization in carbon-based materials.

3. Experience with cleanroom protocols and nanofabrication for TEM sample prep is highly desirable