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Research Fellow (Microelectronics Reliability & Failure Analysis)
Job post no longer accepts applications
a month ago
Posted date
a month ago
Minimum level
The School of Materials Science & Engineering (MSE) invites applications for the position of Research Fellow.

The Research Fellow is expected to play a lead role in the reliability testing and failure analysis of GaN High Electron Mobility Transistors (HEMT) integrated on silicon CMOS devices. He/she will be involved in carrying out accelerated testing of multiple devices fabricated under different conditions using package/wafer level testing. Failure analysis on the devices will also be carried out using SEM/EDX, TEM, etc. The job will also involve working with researchers from the fabrication and application teams, from School of EEE, NTU and Singapore-MIT Alliance for Research and Technology (SMART).

Key Responsibilities:
  • Carry out reliability study on the CMOS + GaN HEMT ICs fabricated by the other research teams in the programme
  • Carry out failure analysis on the CMOS + GaN HEMT ICs fabricated by the other research teams in the programme
  • Work closely with the research team in LEES in support of the overall programme goals
  • Any other duties as assigned by the PI

Job Requirements
  • Ph.D. degree in the relevant engineering disciplines (e.g., Electrical/Electronic Engineering, Materials Engineering)
  • Experience in device characterization and testing
  • Knowledge in reliability studies such as accelerated testing, failure analysis will be an advantage
  • Good in written & oral English
  • Good working attitude and team player
  • Relevant experience in lieu of PhD degree may be considered

We regret that only shortlisted candidates will be notified.

Hiring Institution: NTU
Related tags
Research Fellow (Microelectronics Reliability & Failure Analysis)
a month ago